Logic Testing and Design for Testability

Logic Testing and Design for Testability

Bibliographic Details
Main Author: Fujiwara, Hideo (Author)
Format: Book
Language:English
Published: Cambridge Mass. Massachusetts Institute of Technology Cambridge Mass. c1985
Series:MIT Press Series in Computer Systems
Subjects:
INTEGRATED CIRCUITS
VLSI

ΒΚΠ - Πατρα: ALFe

Holdings details from ΒΚΠ - Πατρα: ALFe
Call Number: 621.395 FUJ
Copy 1 Available

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