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|a eng
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|a 621.381 5
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|a Butler, Kenneth M.
|9 115999
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| 245 |
1 |
0 |
|a Assesing fault model and test quality
|c Kenneth M. Butler and M. Ray Mercer
|
| 260 |
|
|
|a Boston
|b Kluwer Academic Publishers
|c 1992
|
| 300 |
|
|
|a xviii, 132 p.
|b fig.
|c 24 cm
|
| 490 |
0 |
|
|a Kluwer international series in engineering and computer science
|v 257
|
| 505 |
1 |
|
|a Includes bibliography and index
|
| 650 |
|
4 |
|a Ηλεκτρονικά κυκλώματα
|9 312
|
| 650 |
|
4 |
|a Ψηφιακά κυκλώματα
|9 1637
|
| 650 |
|
4 |
|a Ψηφιακά ηλεκτρονικά
|9 1694
|
| 700 |
1 |
|
|a Mercer, M. Ray
|9 116000
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| 760 |
1 |
|
|a The Kluwer international series in engineering and computer science
|g 257
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| 852 |
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