Assesing fault model and test quality

• Main Author: Butler, Kenneth M.
• Other Authors: Mercer, M. Ray
• Format: Book
• Language: English
• Published: Boston Kluwer Academic Publishers 1992
• Series: Kluwer international series in engineering and computer science 257
• Subjects: Ηλεκτρονικά κυκλώματα; Ψηφιακά κυκλώματα; Ψηφιακά ηλεκτρονικά

Table of Contents:

• Includes bibliography and index