APA (7th ed.) Citation

(1973). The state of the Art:from device testing to reconfigurable systems. FTC/3: International symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973. IEEE Computer Society Press.

Chicago Style (17th ed.) Citation

The State of the Art:from Device Testing to Reconfigurable Systems. FTC/3: International Symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973. New York: IEEE Computer Society Press, 1973.

MLA (8th ed.) Citation

The State of the Art:from Device Testing to Reconfigurable Systems. FTC/3: International Symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973. IEEE Computer Society Press, 1973.