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|a Βιβλιοθήκη ΕΑΙΤΥ
|c Βιβλιοθήκη ΕΑΙΤΥ
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| 041 |
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|a eng
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| 245 |
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|a The state of the Art:from device testing to reconfigurable systems. FTC/3
|b International symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973
|
| 260 |
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|a New York
|b IEEE Computer Society Press
|c c1973
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| 300 |
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|a v, 182p.
|b fig.
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| 500 |
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|a Περιέχει βιβλιογραφικές αναφορές
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|
4 |
|a FAULT
|x TOLERANT COMPUTING
|9 113283
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| 650 |
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|9 113284
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4 |
|a IEEE
|9 24256
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| 650 |
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4 |
|a PROCEEDINGS
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| 710 |
2 |
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|a IEEE Computer Society
|4 fnd
|9 23536
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| 852 |
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|a GR-PaULI
|b ΠΑΤΡΑ
|b ΤΜΗΥΠ
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