The state of the Art:from device testing to reconfigurable systems. FTC/3 International symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973

The state of the Art:from device testing to reconfigurable systems. FTC/3 International symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973

Λεπτομέρειες βιβλιογραφικής εγγραφής
Μορφή:	Βιβλίο
Γλώσσα:	English
Έκδοση:	New York IEEE Computer Society Press c1973
Θέματα:	FAULT > TOLERANT COMPUTING FTCS IEEE PROCEEDINGS

Παρόμοια τεκμήρια

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