Digital systems testing and testable design /

• Main Author: Abramovici, Miron (συγγραφέας)
• Other Authors: Breuer, Melvin A., Friedman, Arthur
• Format: Book
• Language: English
• Published: New York : IEEE, c1990.
• Edition: Rev. print.
• Subjects: Ψηφιακά ηλεκτρονικά
• Physical Description: 651 σ. : εικ. ; 23 εκ.
• ISBN: 0780310624