Digital systems testing and testable design /
| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
New York :
IEEE,
c1990.
|
| Edition: | Rev. print. |
| Subjects: |
ΒΚΠ - Πατρα: BSC
| Call Number: |
621.395 Α |
|---|---|
| Copy 1 | Available |
ΒΚΠ - Πατρα: ALFf
| Call Number: |
621.381 548 ABR |
|---|---|
| Copy 1 | Available |
| Copy 2 | Available |
| Copy 4 | Available |
| Copy 6 | Available |
ΒΚΠ - Πατρα: ALFe
| Call Number: |
621.381 548 ABR |
|---|---|
| Copy 3 | Available |
| Copy 5 | Available |
ΒΚΠ - Πατρα: ALFg
| Call Number: |
621.395 ABR |
|---|---|
| Copy Unknown | Available |
| Copy Unknown | Available |
| Copy Unknown | Available |
| Copy Unknown | Available |
