Measurement and Modeling of Computer Systems (1998) Proceedings of the ACM SGMETRICS Joint Intern. Conference 1998 Madison, Wiskonsin, June 22-26 ACM SIGMETRICS Special Issue vol. 26, no 1 1998 ACM SIGMETRICS and IFIP Working Group 7.3

Bibliographic Details
Format: Book
Language:English
Published: New York Association for Computing Machinery c1998
Subjects:
Description
Item Description:βιβλιογραφια ανα κεφαλαιο
Physical Description:282p. fig. index
ISBN:0 89791 982 3