APA (7th ed.) Citation

Sachdev, M. (1998). Defect Oriented Testing for CMOS Analog and Digital Circuits. Kluwer Academic Publishers.

Chicago Style (17th ed.) Citation

Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Boston: Kluwer Academic Publishers, 1998.

MLA (8th ed.) Citation

Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Kluwer Academic Publishers, 1998.

Warning: These citations may not always be 100% accurate.