|
|
|
|
| LEADER |
01251cam a22003013u 4500 |
| 001 |
10105287 |
| 003 |
upatras |
| 005 |
20210526153013.0 |
| 008 |
991022s eng |
| 020 |
|
|
|a 0 7923 8083 5
|
| 040 |
|
|
|a Βιβλιοθήκη ΕΑΙΤΥ
|c Βιβλιοθήκη ΕΑΙΤΥ
|
| 041 |
0 |
|
|a eng
|
| 245 |
1 |
0 |
|a Defect Oriented Testing for CMOS Analog and Digital Circuits
|
| 260 |
|
|
|a Boston
|b Kluwer Academic Publishers
|c c1998
|
| 300 |
|
|
|a xiv,308p.
|b fig.
|
| 490 |
0 |
|
|a Frontiers in Electronic Testing / Vishwani D. Agrawal
|
| 500 |
|
|
|a includes bibl. references
|
| 650 |
|
4 |
|a Αναλογικά ολοκληρωμένα κυκλώματα
|9 124142
|
| 650 |
|
4 |
|a CIRCUIT DESIGN
|9 113286
|
| 650 |
|
4 |
|a CMOS
|9 113287
|
| 650 |
|
4 |
|a DIGITAL CIRCUITS
|9 124143
|
| 650 |
|
4 |
|a ΕΠΕΑΕΚ
|9 116438
|
| 700 |
1 |
|
|a Sachdev, Manoj
|4 aut
|9 71664
|
| 760 |
0 |
|
|a Frontiers in Electronic Testing
|
| 852 |
|
|
|a GR-PaULI
|b ΠΑΤΡΑ
|b ΤΜΗΥΠ
|h 621.395 SAC
|t 1
|
| 942 |
|
|
|2 ddc
|
| 952 |
|
|
|0 0
|1 0
|2 ddc
|4 0
|6 621_395000000000000_SAC
|7 0
|8 NFIC
|9 136961
|a LISP
|b LISP
|c ALFf
|d 2016-04-24
|l 0
|o 621.395 SAC
|p 025000281864
|r 2016-04-24 00:00:00
|t 1
|w 2016-04-24
|y BK15
|x Μεταφορά από Τμ. Μηχανικών ΗΥ & Πληροφορικής
|
| 999 |
|
|
|c 89679
|d 89679
|
