Burn-in testing Its quantitatification and optimization
| Main Authors: | Kececioglu, Dimitri (Author), Sun, Feng-Bin (Author) |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Uper Saddle River N.J.
Prentice Hall
c1997
|
| Subjects: |
Similar Items
-
Electron beam testing technology
Published: (1993) -
Multichip module design,fabrication, and testing
by: Licari, James J.
Published: (1995) -
Test Economis and design for testability for electronic circuits and systems
by: Ambler, A. P., et al.
Published: (1995) -
How to Build a Digital Library
by: Witten, I. H. (Ian H.), et al.
Published: (2003) -
Advanced Techniques for embedded systems design adn test
Published: (1998)