Random Testing of Digital Circuits Theory and Applications

• Main Author: David, Rene (Author)
• Format: Book
• Language: English
• Published: New York Marcel Dekker Inc. c1998
• Subjects: DIGITAL INTEGRATED CIRCUITS; INTEGRATED CIRCUITS; Δοκιμές; ΕΠΕΑΕΚ
• Physical Description: xvii,475p. fig.
• ISBN: 0 8247 0182 8