Testing and testable design of high-density random-access memories /

• Main Author: Mazumder, Pinaki (συγγραφέας.)
• Other Authors: Chakraborty, Kanad (συγγραφέας.)
• Format: Book
• Language: English
• Published: Boston, Mass : Kluwer Academic, 1996.
• Series: Frontiers in electronic testing
• Subjects: Μνήμη τυχαίας προσπέλασης