Electron beam testing technology

• Other Authors: Thong, John (Editor)
• Format: Book
• Language: English
• Published: New York Plenum Press c1993
• Series: Microdevices Physics and Fabrication Technologies / Ivor Brodie and Julius J. Muray
• Subjects: ELECTRON BEAMS; Ημιαγωγοί; ΕΠΕΑΕΚ
• Item Description: βιβλιογραφια ανα κεφάλαιο ΕΠΕΑΕΚ/ΙΤΥ
• Physical Description: xvi,462p. fig.
• ISBN: 0 306 44360 0