Electron beam testing technology

Bibliographic Details
Other Authors: Thong, John (Editor)
Format: Book
Language:English
Published: New York Plenum Press c1993
Series:Microdevices Physics and Fabrication Technologies / Ivor Brodie and Julius J. Muray
Subjects:

ΒΚΠ - Πατρα: ALFf

Holdings details from ΒΚΠ - Πατρα: ALFf
Call Number: 621.381 5 THO
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