High-Level Test synthesis of digial VLSI Circuits

High-Level Test synthesis of digial VLSI Circuits

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Tien-Chien Lee, Mike (Συγγραφέας)
Μορφή:	Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston Artech House c1997
Θέματα:	INTEGRATED CIRCUITS VLSI ΕΠΕΑΕΚ

Παρόμοια τεκμήρια

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