|
|
|
|
| LEADER |
01226cam a22002534a 4500 |
| 001 |
12158086 |
| 003 |
GR-PaULI |
| 005 |
20240528110603.0 |
| 008 |
000829s2000 maua b 001 0 eng |
| 010 |
|
|
|a 00046212
|
| 020 |
|
|
|a 0792379918
|
| 040 |
|
|
|a DLC
|c DLC
|d DLC
|b gre
|e AACR2
|
| 082 |
0 |
4 |
|a 621.395
|2 23
|
| 100 |
1 |
|
|a Bushnell, Michael L.
|q (Michael Lee),
|d 1950-
|9 203772
|e συγγραφέας.
|
| 245 |
1 |
0 |
|a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
|c Michael L. Bushnell, Vishwani D. Agrawal.
|
| 260 |
|
|
|a Boston :
|b Kluwer Academic,
|c c2000.
|
| 300 |
|
|
|a xviii, 690 σ. :
|b εικ. ;
|c 26 εκ.
|
| 490 |
1 |
|
|a Frontiers in electronic testing ;
|v 17
|
| 504 |
|
|
|a Περιλαμβάνει βιβλιογραφικές παραπομπές και ευρετήρια.
|
| 650 |
|
4 |
|a Ολοκληρωμένα κυκλώματα
|x Ολοκλήρωση πολύ μεγάλης κλίμακας.
|9 35013
|
| 700 |
1 |
|
|a Agrawal, Vishwani D.,
|d 1943-
|9 203771
|e συγγραφέας.
|
| 942 |
|
|
|2 ddc
|c BK
|
| 952 |
|
|
|0 0
|1 0
|2 ddc
|4 0
|6 621_395000000000000_BUS
|7 0
|9 142230
|a LISP
|b LISP
|c BSC
|d 2016-04-24
|i 365942
|l 0
|o 621.395 BUS
|p 025000310742
|r 2016-04-24 00:00:00
|t 1
|w 2016-04-24
|y BK15
|
| 999 |
|
|
|c 93034
|d 93034
|