APA (7th ed.) Citation

Wang, L., Wu, C., & Wen, X. (2006). VLSI test principles and architectures: Design for testability. Elsevier Morgan Kaufmann Publishers.

Chicago Style (17th ed.) Citation

Wang, Laung-Terng, Cheng-Wen Wu, and Xiaoqing Wen. VLSI Test Principles and Architectures: Design for Testability. Amsterdam ; Boston: Elsevier Morgan Kaufmann Publishers, 2006.

MLA (8th ed.) Citation

Wang, Laung-Terng, et al. VLSI Test Principles and Architectures: Design for Testability. Elsevier Morgan Kaufmann Publishers, 2006.