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|c CEID
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| 040 |
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|a XX-XxUND
|c CEID
|
| 245 |
1 |
0 |
|a Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories
|c Kanad Chakraborty
|c Pinaki Mazumder
|
| 260 |
|
|
|a New Jersey
|b Pearson Education
|c 2002
|
| 300 |
|
|
|a i-xix
|b fig., tab.
|
| 300 |
|
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|a p. 426
|
| 504 |
|
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|a bib. p.p. 377-417
|
| 504 |
|
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|a index p.p. 419-426
|
| 505 |
1 |
|
|a Chapter 1 Reliability and Fault tolerance of Rams p. 1
|a Chapter 2 Diagnosis, repair, and reconfiguration p. 39
|a Chapter 3 Single-Event Effects and their Mitigation p. 115
|a Chapter 4 Error-Correcting Codes p. 217
|a Chapter 5 Yield Modeling and Prediction Techniques p. 277
|a Chapter 6 Physical Design of Built-in-self-repairable rams p. 321
|
| 650 |
|
4 |
|a Μνήμη τυχαίας προσπέλασης
|9 124403
|
| 700 |
1 |
|
|a Chakraborty, Kanad
|4 aut
|9 124405
|
| 700 |
1 |
|
|a Mazumder, Pinaki
|4 aut
|9 124406
|
| 852 |
|
|
|a GR-PaULI
|b ΠΑΤΡΑ
|b ΤΜΗΥΠ
|t 1
|
| 942 |
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|2 ddc
|c BK15
|
