Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories

• Κύριοι συγγραφείς: Chakraborty, Kanad (Συγγραφέας), Mazumder, Pinaki (Συγγραφέας)
• Μορφή: Βιβλίο
• Γλώσσα: Greek
• Έκδοση: New Jersey Pearson Education 2002
• Θέματα: Μνήμη τυχαίας προσπέλασης

Πίνακας περιεχομένων:

• Chapter 1 Reliability and Fault tolerance of Rams p. 1 Chapter 2 Diagnosis, repair, and reconfiguration p. 39 Chapter 3 Single-Event Effects and their Mitigation p. 115 Chapter 4 Error-Correcting Codes p. 217 Chapter 5 Yield Modeling and Prediction Techniques p. 277 Chapter 6 Physical Design of Built-in-self-repairable rams p. 321