Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories

Bibliographic Details
Main Authors: Chakraborty, Kanad (Author), Mazumder, Pinaki (Author)
Format: Book
Language:Greek
Published: New Jersey Pearson Education 2002
Subjects:
Table of Contents:
  • Chapter 1 Reliability and Fault tolerance of Rams p. 1 Chapter 2 Diagnosis, repair, and reconfiguration p. 39 Chapter 3 Single-Event Effects and their Mitigation p. 115 Chapter 4 Error-Correcting Codes p. 217 Chapter 5 Yield Modeling and Prediction Techniques p. 277 Chapter 6 Physical Design of Built-in-self-repairable rams p. 321