Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Czanderna, Alvin W. (Επιμελητής έκδοσης), Madey, Theodore E. (Επιμελητής έκδοσης), Powell, Cedric J. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2002.
• Σειρά: Methods of Surface Characterization ; 5
• Θέματα: Materials science.; Analytical chemistry.; Optical materials.; Electronic materials.; Materials Science.; Characterization and Evaluation of Materials.; Optical and Electronic Materials.; Analytical Chemistry.

Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is...

Πίνακας περιεχομένων:

• Photon Beam Damage and Charging at Solid Surfaces
• Electron Beam Damage at Solid Surfaces
• Ion Beam Bombardment Effects on Solid Surfaces at Energies Used for Sputter Depth Profiling
• Characterization of Surface Topography
• Depth Profiling Using Sputtering Methods.