Electrothermal Analysis of VLSI Systems

• Κύριοι συγγραφείς: Cheng, Yi-Kan (Συγγραφέας), Tsai, Ching-Han (Συγγραφέας), Teng, Chin-Chi (Συγγραφέας), Kang, Sung-Mo Steve (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2002.
• Θέματα: Engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.

 Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students. 

 The Building Blocks -- Power Analysis for CMOS Circuits -- Temperature-dependent MOS Device Modeling -- Thermal Simulation for VLSI Systems -- Fast-timing Electrothermal Simulation -- The Applications -- Temperature-dependent Electromigration Reliability -- Temperature-driven Cell Placement -- Temperature-driven Power and Timing Analysis.