Electrothermal Analysis of VLSI Systems

• Κύριοι συγγραφείς: Cheng, Yi-Kan (Συγγραφέας), Tsai, Ching-Han (Συγγραφέας), Teng, Chin-Chi (Συγγραφέας), Kang, Sung-Mo Steve (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2002.
• Θέματα: Engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.

Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeli...

Πίνακας περιεχομένων:

• The Building Blocks
• Power Analysis for CMOS Circuits
• Temperature-dependent MOS Device Modeling
• Thermal Simulation for VLSI Systems
• Fast-timing Electrothermal Simulation
• The Applications
• Temperature-dependent Electromigration Reliability
• Temperature-driven Cell Placement
• Temperature-driven Power and Timing Analysis.