Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Εμφάνιση άλλων εκδόσεων (1)

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Bushnell, Michael L. (Συγγραφέας), Agrawal, Vishwani D. (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2002.
Σειρά:	Frontiers in Electronic Testing, 17
Θέματα:	Engineering. Computers. Computer-aided engineering. Electrical engineering. Electronics. Microelectronics. Electronic circuits. Electronics and Microelectronics, Instrumentation. Theory of Computation. Circuits and Systems. Electrical Engineering. Computer-Aided Engineering (CAD, CAE) and Design.
Διαθέσιμο Online:	Full Text via HEAL-Link

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