Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

• Κύριοι συγγραφείς: Bushnell, Michael L. (Συγγραφέας), Agrawal, Vishwani D. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2002.
• Σειρά: Frontiers in Electronic Testing, 17
• Θέματα: Engineering.; Computers.; Computer-aided engineering.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Electronics and Microelectronics, Instrumentation.; Theory of Computation.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have...

Πίνακας περιεχομένων:

• to Testing
• VLSI Testing Process and Test Equipment
• Test Economics and Product Quality
• Fault Modeling
• Test Methods
• Logic and Fault Simulation
• Testability Measures
• Combinational Circuit Test Generation
• Sequential Circuit Test Generation
• Memory Test
• DSP-Based Analog and Mixed-Signal Test
• Model-Based Analog and Mixed-Signal Test
• Delay Test
• IDDQ Test
• Design for Testability
• Digital DFT and Scan Design
• Built-In Self-Test
• Boundary Scan Standard
• Analog Test Bus Standard
• System Test and Core-Based Design
• The Future of Testing.