A Designer’s Guide to Built-In Self-Test

• Κύριος συγγραφέας: Stroud, Charles E. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2002.
• Σειρά: Frontiers in Electronic Testing, 19
• Θέματα: Engineering.; Computer-aided engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is w...

Πίνακας περιεχομένων:

• An Overview of BIST
• Fault Models, Detection, and Simulation
• Design for Testability
• Test Pattern Generation
• Output Response Analysis
• Manufacturing and System-Level Use of BIST
• Built-In Logic Block Observer
• Pseudo-Exhaustive BIST
• Circular BIST
• Scan-Based BIST
• Non-Intrusive BIST
• BIST for Regular Structures
• BIST for FPGAs and CPLDs
• Applying Digital BIST to Mixed-Signal Systems
• Merging BIST and Concurrent Fault Detection.