A Designer’s Guide to Built-In Self-Test

• Main Author: Stroud, Charles E. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2002.
• Series: Frontiers in Electronic Testing, 19
• Subjects: Engineering.; Computer-aided engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is w...