Design for AT-Speed Test, Diagnosis and Measurement
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how...
Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
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Άλλοι συγγραφείς: | Nadeau-Dostie, Benoit (Επιμελητής έκδοσης) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Boston, MA :
Springer US,
2000.
|
Σειρά: | Frontiers in Electronic Testing,
15 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
-
High-speed CMOS Circuits for Optical Receivers
ανά: Savoj, Jafar, κ.ά.
Έκδοση: (2001) -
High Speed Serdes Devices and Applications
ανά: Rockrohr, James Donald, κ.ά.
Έκδοση: (2009) -
Circuit Techniques for Low-Voltage and High-Speed A/D Converters
ανά: Waltari, Mikko E., κ.ά.
Έκδοση: (2002) -
Boundary-Scan Interconnect Diagnosis
ανά: Sousa, José T. de, κ.ά.
Έκδοση: (2001) -
Design of Systems on a Chip: Design and Test
Έκδοση: (2007)