Design for AT-Speed Test, Diagnosis and Measurement

• Corporate Author: SpringerLink (Online service)
• Other Authors: Nadeau-Dostie, Benoit (Editor)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2000.
• Series: Frontiers in Electronic Testing, 15
• Subjects: Engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how...