High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

• Κύριος συγγραφέας: Adams, R. Dean (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2003.
• Σειρά: Frontiers in Electronic Testing, 22A
• Θέματα: Engineering.; Computer-aided engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and te...

Πίνακας περιεχομένων:

• Test of Memories
• Opening Pandora’s Box
• Static Random Access Memories
• Multi-Port Memories
• Silicon On Insulator Memories
• Content Addressable Memories
• Dynamic Random Access Memories
• Non-Volatile Memories
• Memory Testing
• Memory Faults
• Memory Patterns
• Memory Self Test
• BIST Concepts
• State Machine BIST
• Micro-Code BIST
• BIST and Redundancy
• Design For Test and BIST
• Conclusions.