High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

• Main Author: Adams, R. Dean (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2003.
• Series: Frontiers in Electronic Testing, 22A
• Subjects: Engineering.; Computer-aided engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and te...