The Piezojunction Effect in Silicon Integrated Circuits and Sensors

• Κύριοι συγγραφείς: Fruett, Fabiano (Συγγραφέας), Meijer, Gerard C. M. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2002.
• Σειρά: The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, 682
• Θέματα: Engineering.; Electrical engineering.; Electronic circuits.; Optical materials.; Electronic materials.; Circuits and Systems.; Electrical Engineering.; Optical and Electronic Materials.

Mechanical stress affects the magnitude of base-emitter voltages of forward biased bipolar transistors. This phenomenon is called the piezojunction effect. The piezojunction effect is the main cause of inaccuracy and drift in integrated temperature sensors and bandgap voltage references. The aim of...

Πίνακας περιεχομένων:

• Mechanical stress in integrated circuits
• Piezo effects in silicon
• Characterization of the piezojunction effect
• Minimizing the piezojunction and piezoresistive effects in integrated devices
• Minimizing the inaccuracy in packaged integrated circuits
• Stress-sensing elements based on the piezojunction effect
• Conclusions.