APA (7th ed.) Citation

Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained Testing of VLSI Circuits. Springer US.

Chicago Style (17th ed.) Citation

Nicolici, Nicola, and Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston, MA: Springer US, 2003.

MLA (8th ed.) Citation

Nicolici, Nicola, and Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Springer US, 2003.