| Περίληψη: | MODERN TECHNIQUES FOR CHARACTERIZING MAGNETIC MATERIALS provides an extensive overview of novel characterization tools for magnetic materials including neutron, photon and electron scatterings and other microscopy techniques by world renowned scientists. This is an interdisciplinary book. Currently there is no existing book that describes all available techniques to characterize and to understand magnetic materials. These techniques cover a wide range of length scales and belong to different scientific communities that have little cross-discipline communication. The book will build bridges for them. It is important to note that each technique has its own advantages and drawbacks. Very often combined use of different techniques is essential to the understanding of the ever increasing complexity of modern magnetic materials at nanometer scales. The book includes, but is not limited to the following areas: Magnetic neutron scattering with 3-axis spectrometer * Small-angle neutrons scattering * Polarized neutron magnetic reflectometry * Resonant soft x-ray magneto-optic scattering * Magnetic hard x-ray scattering * Spin resolved photoemission spectroscopy * Lorentz microscopy and electron holography * Scanning electron microscopy with polarization analysis * Spin polarized low energy electron microscopy * Spin-polarized scanning tunneling microscopy * Magnetic force microscopy * Near-field scanning optical microscopy * Time-resolved scanning Kerr microscopy * Brillouin light scattering spectroscopy This reference will be a valuable resource for all graduate students, researchers, engineers and scientists who are interested in magnetic materials including their crystal structure, electronic structure, magnetization dynamics and their associated magnetic properties and underlying magnetism.
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