Advanced BDD Optimization
VLSI CADhas greatly bene?ted from the use of reduced ordered Binary Decision Diagrams (BDDs) and the clausal representation as a problem of Boolean Satis?ability (SAT), e.g. in logic synthesis, ver- cation or design-for-testability. In recent practical applications, BDDs are optimized with respect t...
Κύριοι συγγραφείς: | Ebendt, Rüdiger (Συγγραφέας), Fey, Görschwin (Συγγραφέας), Drechsler, Rolf (Συγγραφέας) |
---|---|
Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Boston, MA :
Springer US,
2005.
|
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
-
Introduction to Advanced System-on-Chip Test Design and Optimization
ανά: Larsson, Erik
Έκδοση: (2005) -
Oscillation-Based Test in Mixed-Signal Circuits
ανά: Sánchez, Gloria Huertas, κ.ά.
Έκδοση: (2006) -
Model and Design of Bipolar and MOS Current-Mode Logic CML, ECL and SCL Digital Circuits /
ανά: Alioto, Massimo, κ.ά.
Έκδοση: (2005) -
Analog Circuit Design RF Circuits: Wide band, Front-Ends, DAC's, Design Methodology and Verification for RF and Mixed-Signal Systems, Low Power and Low Voltage /
Έκδοση: (2006) -
Calibration techniques in nyquist A/D converters
ανά: Ploeg, Hendrik van der, κ.ά.
Έκδοση: (2006)