Dynamic Characterisation of Analogue-to-Digital Converters

• Κύριοι συγγραφείς: Dallet, Dominique (Συγγραφέας), Silva, José Machado da (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2005.
• Σειρά: The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, 860
• Θέματα: Engineering.; Physical measurements.; Measurement.; Engineering design.; Electrical engineering.; Microwaves.; Optical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Engineering Design.; Electronics and Microelectronics, Instrumentation.; Microwaves, RF and Optical Engineering.; Measurement Science and Instrumentation.

The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system’s performance and flexibility. Knowing accurately all the param...

Πίνακας περιεχομένων:

• ADC Characterisation Based on Sinewave Analysis
• ADC Applications, Architectures and Terminology
• Sinewave Test Setup
• Time-Domain Data Analysis
• Frequency-Domain Data Analysis
• Code Histogram Test
• Comparative Study of ADC Sinewave Test Methods
• Measurement of Additional Parameters
• Jitter Measurement
• Differential Gain and Phase Testing
• Step and Transient Response Measurement
• Hysteresis Measurement.