Egerton, R. F. (2005). Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer US : Imprint: Springer.
Chicago Style (17th ed.) CitationEgerton, Ray F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Boston, MA: Springer US : Imprint: Springer, 2005.
MLA (8th ed.) CitationEgerton, Ray F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer US : Imprint: Springer, 2005.
Warning: These citations may not always be 100% accurate.