Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

• Κύριος συγγραφέας: Egerton, Ray F. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US : Imprint: Springer, 2005.
• Θέματα: Materials science.; Microscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Biological Microscopy.

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction...