Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

• Main Author: Egerton, Ray F. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US : Imprint: Springer, 2005.
• Subjects: Materials science.; Microscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Biological Microscopy.

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction...