Huisman, L. M. (2005). Data Mining and Diagnosing IC Fails. Springer US.
Chicago Style (17th ed.) CitationHuisman, Leendert M. Data Mining and Diagnosing IC Fails. Boston, MA: Springer US, 2005.
MLA (8th ed.) CitationHuisman, Leendert M. Data Mining and Diagnosing IC Fails. Springer US, 2005.
Warning: These citations may not always be 100% accurate.