Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility /

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Sta...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Ben Dhia, Sonia (Επιμελητής έκδοσης), Ramdani, Mohamed (Επιμελητής έκδοσης), Sicard, Etienne (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Boston, MA : Springer US : Imprint: Springer, 2006.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
LEADER 02961nam a22005655i 4500
001 978-0-387-26601-5
003 DE-He213
005 20151204140641.0
007 cr nn 008mamaa
008 100301s2006 xxu| s |||| 0|eng d
020 |a 9780387266015  |9 978-0-387-26601-5 
024 7 |a 10.1007/b137864  |2 doi 
040 |d GrThAP 
050 4 |a TK7876-7876.42 
072 7 |a TJFN  |2 bicssc 
072 7 |a TEC024000  |2 bisacsh 
072 7 |a TEC030000  |2 bisacsh 
082 0 4 |a 621.3  |2 23 
245 1 0 |a Electromagnetic Compatibility of Integrated Circuits  |h [electronic resource] :  |b Techniques for low emission and susceptibility /  |c edited by Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard. 
264 1 |a Boston, MA :  |b Springer US :  |b Imprint: Springer,  |c 2006. 
300 |a XIII, 473 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Basic Concepts in EMC for ICs -- Historical Review and State-of-the art -- Fundamentals and Theory -- Measurement Methods -- EMC Modeling -- Case Studies -- Guidelines. 
520 |a Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. 
650 0 |a Engineering. 
650 0 |a Computer-aided engineering. 
650 0 |a Automotive engineering. 
650 0 |a Microwaves. 
650 0 |a Optical engineering. 
650 0 |a Electronics. 
650 0 |a Microelectronics. 
650 0 |a Electronic circuits. 
650 1 4 |a Engineering. 
650 2 4 |a Microwaves, RF and Optical Engineering. 
650 2 4 |a Electronics and Microelectronics, Instrumentation. 
650 2 4 |a Circuits and Systems. 
650 2 4 |a Automotive Engineering. 
650 2 4 |a Computer-Aided Engineering (CAD, CAE) and Design. 
700 1 |a Ben Dhia, Sonia.  |e editor. 
700 1 |a Ramdani, Mohamed.  |e editor. 
700 1 |a Sicard, Etienne.  |e editor. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9780387266008 
856 4 0 |u http://dx.doi.org/10.1007/b137864  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)