Gizopoulos / Advances in ElectronicTesting
Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and devel...
Συγγραφή απο Οργανισμό/Αρχή: | |
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Άλλοι συγγραφείς: | |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Boston, MA :
Springer US,
2006.
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Σειρά: | Frontiers in Electronic Testing,
27 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Defect-Orinted Testing
- Failure Mechanisms and Testing in Nanometer Technologies
- Silicon Debug
- Delay Testing
- High-Speed Digital Test Interfaces
- DFT_Oriented,Low-Cost Testers
- Embedded Cores and System-on-Chip Testing
- Embedded MemoryTesting
- Mixed-Signal Testing and DfT
- RF Testing
- Loaded Board Testing.