Gizopoulos / Advances in ElectronicTesting

• Corporate Author: SpringerLink (Online service)
• Other Authors: Gizopoulos, Dimitris (Editor)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2006.
• Series: Frontiers in Electronic Testing, 27
• Subjects: Engineering.; Computer software > Reusability.; Engineering design.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Optical materials.; Electronic materials.; Circuits and Systems.; Engineering Design.; Electronics and Microelectronics, Instrumentation.; Optical and Electronic Materials.; Electrical Engineering.; Performance and Reliability.

Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and devel...

Table of Contents:

• Defect-Orinted Testing
• Failure Mechanisms and Testing in Nanometer Technologies
• Silicon Debug
• Delay Testing
• High-Speed Digital Test Interfaces
• DFT_Oriented,Low-Cost Testers
• Embedded Cores and System-on-Chip Testing
• Embedded MemoryTesting
• Mixed-Signal Testing and DfT
• RF Testing
• Loaded Board Testing.