The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™ /
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM provides insight into the rules and recommendations of IEEE Std. 1500. The authors present background information about some of the choices and decisions made throughout the design of this IEEE standard conceived to enable...
| Main Authors: | Silva, Francisco da (Author), McLaurin, Teresa (Author), Waayers, Tom (Author) |
|---|---|
| Corporate Author: | SpringerLink (Online service) |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2006.
|
| Series: | Frontiers in Electronic Testing,
35 |
| Subjects: | |
| Online Access: | Full Text via HEAL-Link |
Similar Items
-
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500β'
by: Silva, Francisco
Published: (2006) -
Nanometer Technology Designs High-Quality Delay Tests
by: Tehranipoor, Mohammad, et al.
Published: (2008) -
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
by: Bushnell, Michael L., et al.
Published: (2002) -
Ultra Low-Power Electronics and Design
Published: (2004) -
Substrate Noise Coupling in Mixed-Signal ASICs
Published: (2003)