Foster, A., & Hofer, W. (2006). Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer New York.
Chicago Style (17th ed.) CitationFoster, Adam, and Werner Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. New York, NY: Springer New York, 2006.
MLA (8th ed.) CitationFoster, Adam, and Werner Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer New York, 2006.
Warning: These citations may not always be 100% accurate.