Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents /

• Κύριοι συγγραφείς: Foster, Adam (Συγγραφέας), Hofer, Werner (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2006.
• Σειρά: NanoScience and Technology,
• Θέματα: Materials science.; Atomic structure.; Molecular structure.; Spectra.; Solid state physics.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Thin films.; Materials Science.; Characterization and Evaluation of Materials.; Surfaces and Interfaces, Thin Films.; Atomic/Molecular Structure and Spectra.; Solid State Physics.; Spectroscopy and Microscopy.

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives...