Metric- Driven Design Verification An Engineer's and Executive's Guide to First Pass Success /
Exponentially increasing design complexity has necessitated the adoption of metric driven planning and project management. Metric Driven Design Verification provides the semiconductor industry’s first metric driven based approach to functional verification. A metric based flow is described that focu...
| Main Authors: | Carter, Hamilton B. (Author), Hemmady, Shankar (Author) |
|---|---|
| Corporate Author: | SpringerLink (Online service) |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2007.
|
| Subjects: | |
| Online Access: | Full Text via HEAL-Link |
Similar Items
-
Effective Functional Verification Principles and Processes /
by: Vasudevan, Srivatsa
Published: (2006) -
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition /
Published: (2007) -
Physical Design Essentials An ASIC Design Implementation Perspective /
by: Golshan, Khosrow
Published: (2007) -
CPU Design: Answers to Frequently Asked Questions
by: Thimmannagari, Chandra M. R.
Published: (2005) -
Sub-threshold Design for Ultra Low-Power Systems
by: Wang, Alice, et al.
Published: (2006)