Scanning Microscopy for Nanotechnology Techniques and Applications /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Zhou, Weilie (Επιμελητής έκδοσης), Wang, Zhong Lin (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2007.
• Θέματα: Materials science.; Physical measurements.; Measurement.; Optical materials.; Electronic materials.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Optical and Electronic Materials.; Measurement Science and Instrumentation.

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...